Title

Test Procedure For Short-life Rating Of Composition Resistors

Date

1953

Index Abstract

Coming Soon

Photo Quality

Undetermined

Report Number

WADC TR 53-349

Creator

Bridges, D. B. J.

Graham, J. H.

Sackett, W. T.

Corporate Author

Battelle Memorial Institute

Extent

98

PB Number

PB122120

NTRL Accession Number

AD018756

Identifier

AD0018756

Access Rights

Unknown

Distribution Classification

1

Contract

AF 33(038)-1229

DTIC Record Exists

Yes

Distribution Change Authority Correspondence

AFAL ltr

Distribution Change Action Date

10/16/2001

Distribution Conflict

Fix

Abstract

A short-life rating procedure is given for abnormal operation of composition resistors. Consideration was given to high ambient temperature, altitude, load, humidity, and vibration. Details of equipment, methods of measurement, and mounting of samples are described. The rating procedure utilizes sequential sampling, pre-conditioning of resistors, and statistical treatment of the data. Theoretical and experimental considerations leading to the procedure are given. The applicability of the rating procedure to other electronic components is indicated.

Report Availability

Not available via Contrails

Date Issued

1953-07

Index In

DTIC

Type

report