columbus · Determination of Scattering Potential from the Spectral Measure Function Part II: Point Eigenvalues and Proper Eigenfunctions

Determination of Scattering Potential from the Spectral Measure Function Part II: Point Eigenvalues and Proper Eigenfunctions

Title: Determination of Scattering Potential from the Spectral Measure Function Part II: Point Eigenvalues and Proper Eigenfunctions
Date: 1955
Index Abstract: Online
Photo Quality: Undetermined
Report Number: AFCRC TN 55-40
Creator: Kay, Irvin; Moses, Harry E.
Corporate Author: New York University
Extent: 24
PB Number: PB118162
Identifier: AD0064513
Access Rights: Unknown
Distribution Classification: 2
DTIC Record Exists: No
Distribution Change Authority Correspondence: None
Distribution Conflict: Yes
Index Price: $2.70
Report Availability: Not available via Contrails
Date Issued: 1955-06
Abstract: The abstract for this report is either unavailable or has yet to be entered
Index In: U.S. Government Research Reports
Type: report

Media: http://contrails.iit.edu/DigitalCollection/abstracts/images/PB118162.gif