columbus · Low Temperature X-Ray Diffraction Techniques: I. Review and Bibliography II. A Low Temperature Specimen Mount for the Siemens Horizontal Diffractometer

Low Temperature X-Ray Diffraction Techniques: I. Review and Bibliography II. A Low Temperature Specimen Mount for the Siemens Horizontal Diffractometer

Title: Low Temperature X-Ray Diffraction Techniques: I. Review and Bibliography II. A Low Temperature Specimen Mount for the Siemens Horizontal Diffractometer
Date: 1963
Index Abstract: Coming Soon
Photo Quality: Incomplete
Report Number: ASD TDR 63-278
Creator: Baun, William L.; Renton, John J.
Corporate Author: Directorate of Materials and Processes
Laboratory: Directorate of Materials and Processes
Extent: 26
Identifier: AD408705
Access Rights: OTS
Distribution Classification: 1
Contract: Laboratory Research - No Contract
DoD Project: 7360
DoD Task: 736005
DTIC Record Exists: No
Distribution Change Authority Correspondence: None
Report Availability: Full text available by request
Date Issued: 1963-04
Abstract: The abstract for this report is either unavailable or has yet to be entered
Type: report
Provenance: Lockheed Martin Missiles & Fire Control
Format: 26 pages ; 28 cm.