Title

High Resolution Cathode Ray Tube Evaluation

Date

1964

Index Abstract

Not Available

Photo Quality

Complete

Report Number

ASD-TDR-63-796

Corporate Author

Data Corporation

Laboratory

Director of Reconnaissance Engineering

Extent

104

Identifier

AD0600517

AD0600517

Access Rights

OTS

Distribution Classification

1

Contract

AF33(616)-4206

DTIC Record Exists

Yes

Distribution Change Authority Correspondence

None

Distribution Conflict

No

Abstract

This report outlines and provides a means of comparing the four basic methods of CRT testing now employed by the cathode ray tube industry. An analysis of each test method, its restrictions, limitations, and advantages are discussed along with the basic requirements for testing cathode ray tubes. These four methods are selected by a joint industry-government committee as possible test standards. They are: (1) Shrinking Raster Technique, (2) Schade Spatial Frequency Technique, (3) Line Profile and Single Slit Technique, (4) Double Line Trace Technique (Westinghouse Method). Five high resolution cathode ray tubes were subjected to the four methods of tests and the results indicated for comparison. The appendix gives a detailed description of the CRT Analyser designed and built by Data Corporation for performing the various tests described.

Report Availability

Full text available

Date Issued

1964-04

Date Modified

Scanned by request 7/1/2020 submitted by a private citizen (Private Citizen - No Affiliation)

Provenance

IIT

Type

report

Format

1 online resource