Impact of Nonoperating Periods on Equipment Reliability

Item

Title
Impact of Nonoperating Periods on Equipment Reliability
Creator
Coit, David W.
Priore, Mary G.
Publisher
Griffiss Air Force Base, NY : Rome Air Development Center
Date
1985
Identifier
ADA158843
ADA158843
Abstract
The objective of this study was to develop a procedure to predict the quantitative effects of nonoperating periods on electronic equipment reliability. A series of nonoperating failure rate prediction models were developed at the component level. The models are capable of evaluating component nonoperating failure rate for any anticipated environment with the exception of a satellite environment. The proposed nonoperating failure rate prediction methodology is intended to provide the ability to predict the component nonoperating failure rate and reliability as a function of the characteristics of the devices, technology employed in producing the device, and external factors such as environmental stresses which have a significant effect on device nonoperating reliability. The prediction methodology is presented in a form compatible with MIL-HDBK-217 as an Appendix to the technical report. Additional keywords: Dormancy; Power on off cycling; Tables(Data); Data acquisition; Mathematical models; Microcircuits; Discrete semiconductors; Resistors; Capacitors; Inductive devices; Lasers; Tubes; Mechanical/electromechanical devices; and Circuit interconnectors.
Date Issued
1985-05
Extent
441
Corporate Author
IIT Research Institute
Laboratory
Rome Air Development Center
Report Number
RADC-TR-85-91
Contract
F30602-83-C-0056
DoD Project
2338
DoD Task
233802
Distribution Conflict
No
Access Rights
APPROVED FOR PUBLIC RELEASE; DISTRIBUTION UNLIMITED
Photo Quality
Not Needed
Distribution Classification
1
DTIC Record Exists
Yes
Report Availability
Full text available by request
Provenance
Underwriters Laboratories (UL)
Type
report