Title

Impact of Nonoperating Periods on Equipment Reliability

Creator

Coit, David W.

Priore, Mary G.

Publisher

Griffiss Air Force Base, NY : Rome Air Development Center

Date

1985

Identifier

ADA158843

ADA158843

Abstract

The objective of this study was to develop a procedure to predict the quantitative effects of nonoperating periods on electronic equipment reliability. A series of nonoperating failure rate prediction models were developed at the component level. The models are capable of evaluating component nonoperating failure rate for any anticipated environment with the exception of a satellite environment. The proposed nonoperating failure rate prediction methodology is intended to provide the ability to predict the component nonoperating failure rate and reliability as a function of the characteristics of the devices, technology employed in producing the device, and external factors such as environmental stresses which have a significant effect on device nonoperating reliability. The prediction methodology is presented in a form compatible with MIL-HDBK-217 as an Appendix to the technical report. Additional keywords: Dormancy; Power on off cycling; Tables(Data); Data acquisition; Mathematical models; Microcircuits; Discrete semiconductors; Resistors; Capacitors; Inductive devices; Lasers; Tubes; Mechanical/electromechanical devices; and Circuit interconnectors.

Date Issued

1985-05

Extent

441

Corporate Author

IIT Research Institute

Laboratory

Rome Air Development Center

Report Number

RADC-TR-85-91

Contract

F30602-83-C-0056

DoD Project

2338

DoD Task

233802

Distribution Conflict

No

Access Rights

APPROVED FOR PUBLIC RELEASE; DISTRIBUTION UNLIMITED

Photo Quality

Not Needed

Distribution Classification

1

DTIC Record Exists

Yes

Report Availability

Full text available by request

Provenance

Underwriters Laboratories (UL)

Type

report