Microcircuit Screening Effectiveness

Item

Title
Microcircuit Screening Effectiveness
Publisher
Griffiss AFB, NY : Rome Air Development Center
Date
1978
Identifier
ADA063166
ADA063166
Abstract
The purpose of this report is to broaden the readers awareness of the factors affecting the reliability of microelectronics through the application of screening techniques. The information compiled within this document should provide a valuable resource to those responsible for design, specification, testing and failure analysts of integrated circuits. This document is prepared as part of the Reliability Analysis Center's (RAC) continued responsibility to provide new information on the reliability of electronic devices. The bulk of the information reported herein has been obtained through an active data solicitation program. The reliability data related to component screening in this document have also been, or will be, reported in the RAC Data Publication Series. This report is one of a new series of documents being prepared by RAC treating topics of particular interest to the electronics industry. Other technical reports under preparation include:
Failure Mechanisms of Microcircuit Metallizations
Electrostatic Discharge Damage in Microcircuits
The primary responsibility for the compilation and accuracy of this document rests with Mr. H. C. Rickers and the Reliability Analysis Center staff. However, equal credit must be given to the many people who performed the tests and took the time and effort to document their results.
Date Issued
1978
Date Modified
Scanned and posted 7/10/2018
Extent
117
Corporate Author
Reliability Analysis Center (IIT Research Institute)
Laboratory
Reliability Analysis Center
Report Number
TRS-1
Contract
F30602-78-C-0281
Distribution Conflict
No
Access Rights
Approved for Public Release, Distribution Unlimited
Cover Price
$30.00
Photo Quality
Not Needed
Distribution Classification
1
DTIC Record Exists
Yes
Report Availability
Full text available
Provenance
Motorola Mobility
Type
report
Subject
Integrated Circuits
Microcircuits
Reliability
Defects (Materials)
Failure (Electronics)
Low Costs
Shock Resistance
Thermal Stability
Format
1 online resource
Creator
Rickers, Henry C.
Media
TRS-1.pdf