Title

Microcircuit Screening Effectiveness

Publisher

Griffiss AFB, NY : Rome Air Development Center

Date

1978

Identifier

ADA063166

ADA063166

Abstract

The purpose of this report is to broaden the readers awareness of the factors affecting the reliability of microelectronics through the application of screening techniques. The information compiled within this document should provide a valuable resource to those responsible for design, specification, testing and failure analysts of integrated circuits. This document is prepared as part of the Reliability Analysis Center's (RAC) continued responsibility to provide new information on the reliability of electronic devices. The bulk of the information reported herein has been obtained through an active data solicitation program. The reliability data related to component screening in this document have also been, or will be, reported in the RAC Data Publication Series. This report is one of a new series of documents being prepared by RAC treating topics of particular interest to the electronics industry. Other technical reports under preparation include:
Failure Mechanisms of Microcircuit Metallizations
Electrostatic Discharge Damage in Microcircuits
The primary responsibility for the compilation and accuracy of this document rests with Mr. H. C. Rickers and the Reliability Analysis Center staff. However, equal credit must be given to the many people who performed the tests and took the time and effort to document their results.

Date Issued

1978

Date Modified

Scanned and posted 7/10/2018

Extent

117

Corporate Author

Reliability Analysis Center (IIT Research Institute)

Laboratory

Reliability Analysis Center

Report Number

TRS-1

Contract

F30602-78-C-0281

Distribution Conflict

No

Access Rights

Approved for Public Release, Distribution Unlimited

Cover Price

$30.00

Photo Quality

Not Needed

Distribution Classification

1

DTIC Record Exists

Yes

Report Availability

Full text available

Provenance

Motorola Mobility

Type

report

Subject

Integrated Circuits

Microcircuits

Reliability

Defects (Materials)

Failure (Electronics)

Low Costs

Shock Resistance

Thermal Stability

Format

1 online resource

Creator

Rickers, Henry C.